TestType Structure for Sensor Tile
Notice
Page generated: 2023-06-01
See source code here
For updates/fixes contact: wraightATcern.ch
Tables generated from PDB componentType data-strucutre
Tests Per Stage
stage code: sensor_manufacturer
test_name |
test_code |
test_order |
CV measurement |
CV_MEASURE |
1 |
IV measurement |
IV_MEASURE |
2 |
stage code: WAFER_PROCESSING
test_name |
test_code |
test_order |
Visual inspection |
VISUAL_INSPECTION |
1 |
Sensor Metrology: Sensor bow and thickness |
SENSOR_METROLOGY |
2 |
IV measurement |
IV_MEASURE |
3 |
CV measurement |
CV_MEASURE |
4 |
stage code: QA
test_name |
test_code |
test_order |
CV measurement |
CV_MEASURE |
1 |
IV measurement |
IV_MEASURE |
2 |
IT measurement |
IT_MEASURE |
3 |
Inter-pixel capacitance |
INTER-PIXEL_CAPACITANCE |
4 |
Inter-pixel resistance |
INTER-PIXEL_RESISTANCE |
5 |
Sensor Metrology: Sensor bow and thickness |
SENSOR_METROLOGY |
6 |
stage code: POST_IRRAD
test_name |
test_code |
test_order |
IV measurement |
IV_MEASURE |
0 |
CV measurement |
CV_MEASURE |
1 |
stage code: NOT_USED
test_name |
test_code |
test_order |
nan |
nan |
nan |
stage code: BAREMODULEASSEMBLY
test_name |
test_code |
test_order |
nan |
nan |
nan |
stage code: BAREMODULERECEPTION
test_name |
test_code |
test_order |
IV measurement |
IV_MEASURE |
1 |
stage code: MODULE/ASSEMBLY
test_name |
test_code |
test_order |
nan |
nan |
nan |
stage code: MODULE/WIREBONDING
test_name |
test_code |
test_order |
nan |
nan |
nan |
stage code: MODULE/INITIAL_WARM
test_name |
test_code |
test_order |
nan |
nan |
nan |
stage code: MODULE/INITIAL_COLD
test_name |
test_code |
test_order |
nan |
nan |
nan |
stage code: MODULE/PARYLENE_MASKING
test_name |
test_code |
test_order |
nan |
nan |
nan |
stage code: MODULE/PARYLENE_COATING
test_name |
test_code |
test_order |
nan |
nan |
nan |
stage code: MODULE/PARYLENE_UNMASKING
test_name |
test_code |
test_order |
nan |
nan |
nan |
stage code: MODULE/POST_PARYLENE_WARM
test_name |
test_code |
test_order |
nan |
nan |
nan |
stage code: MODULE/POST_PARYLENE_COLD
test_name |
test_code |
test_order |
nan |
nan |
nan |
stage code: MODULE/WIREBOND_PROTECTION
test_name |
test_code |
test_order |
nan |
nan |
nan |
stage code: MODULE/THERMAL_CYCLES
test_name |
test_code |
test_order |
nan |
nan |
nan |
stage code: MODULE/LONG_TERM_STABILITY_TEST
test_name |
test_code |
test_order |
nan |
nan |
nan |
stage code: MODULE/FINAL_WARM
test_name |
test_code |
test_order |
nan |
nan |
nan |
stage code: MODULE/FINAL_COLD
test_name |
test_code |
test_order |
nan |
nan |
nan |
stage code: MODULE/UNHAPPY
test_name |
test_code |
test_order |
nan |
nan |
nan |
stage code: MODULE/COMPLETE
test_name |
test_code |
test_order |
nan |
nan |
nan |
Test Details
test code: CV_MEASURE
stages: sensor_manufacturer, WAFER_PROCESSING, QA, POST_IRRAD
properties
name |
code |
description |
dataType |
valueType |
required |
Temperature (°C) |
TEMP |
Measured temperature during testing |
float |
single |
True |
Humidity (%) |
HUM |
Measured relative humidity during testing |
float |
single |
True |
Analysis Version |
ANALYSIS_VERSION |
Analysis Version |
string |
single |
False |
parameters
name |
code |
description |
dataType |
valueType |
required |
Full depletion voltage (V) |
V_FULLDEPL |
Measured voltage for full depletion |
float |
single |
True |
Plot of CV curves |
CV_IMG |
CV characteristics |
image |
single |
True |
CV data |
CV_ARRAY |
CV data dictionary |
object |
single |
True |
test code: IV_MEASURE
stages: sensor_manufacturer, WAFER_PROCESSING, QA, POST_IRRAD, BAREMODULERECEPTION
properties
name |
code |
description |
dataType |
valueType |
required |
Temperature (°C) |
TEMP |
Measured temperature |
float |
single |
True |
Humidity (%) |
HUM |
Measured relative humidity |
float |
single |
True |
Analysis Version |
ANALYSIS_VERSION |
Analysis Version |
string |
single |
False |
parameters
name |
code |
description |
dataType |
valueType |
required |
IV data |
IV_ARRAY |
IV data array |
object |
single |
True |
Plot of IV curves |
IV_IMG |
IV characteristics |
image |
single |
False |
Breakdown voltage (V) |
BREAKDOWN_VOLTAGE |
Measured breakdown voltage |
float |
single |
True |
Leakage current of sensor (μA) |
LEAK_CURRENT |
Measured leakage current of (Planar/3D sensor at depletion voltage + 50V/20V) |
float |
single |
True |
test code: VISUAL_INSPECTION
stages: WAFER_PROCESSING
properties
name |
code |
description |
dataType |
valueType |
required |
Analysis Version |
ANALYSIS_VERSION |
Analysis Version |
string |
single |
False |
parameters
name |
code |
description |
dataType |
valueType |
required |
Comment |
COMMENT |
Comments describing the results of the visual inspection |
string |
single |
True |
Image link |
IMAGE_LINK |
Link to high-resolution images of defects |
string |
single |
True |
test code: SENSOR_METROLOGY
stages: WAFER_PROCESSING, QA
properties
name |
code |
description |
dataType |
valueType |
required |
Analysis Version |
ANALYSIS_VERSION |
Analysis Version |
string |
single |
False |
parameters
name |
code |
description |
dataType |
valueType |
required |
Bow values |
BOW_VALUE |
Measurement of the bow of the sensor tile |
float |
array |
True |
Thickness of sensor tile |
SENSOR_THICK |
Measurement of the thickness of sensor tile |
float |
single |
True |
test code: IT_MEASURE
stages: QA
properties
name |
code |
description |
dataType |
valueType |
required |
Temperature (°C) |
TEMP |
Temperature |
float |
single |
True |
Humidity (%) |
HUM |
Measured relative humidity during testing |
float |
single |
False |
Analysis Version |
ANALYSIS_VERSION |
Analysis Version |
string |
single |
False |
parameters
name |
code |
description |
dataType |
valueType |
required |
Std deviation of leakage current over 48 hours (μA) |
LEAK_48H |
Measured standard deviation of leakage current over 48 hours |
float |
single |
True |
IT Array Data |
IT_ARRAY |
The data associated to the IT plots |
object |
array |
True |
Leakage current (μA) - planar sensor |
LEAK_PLANAR |
Measured leakage current on a planar sensor tile at a bias voltage of Vdepl+50V |
float |
single |
True |
IT image of plot |
IT_IMG |
The plots of the IT curves for each sensor tile on wafer |
image |
single |
True |
test code: INTER-PIXEL_CAPACITANCE
stages: QA
properties
name |
code |
description |
dataType |
valueType |
required |
Analysis Version |
ANALYSIS_VERSION |
Analysis Version |
string |
single |
False |
parameters
name |
code |
description |
dataType |
valueType |
required |
Capacitance measurement |
CAPACITANCE |
Capacitance from test structure |
float |
single |
True |
test code: INTER-PIXEL_RESISTANCE
stages: QA
properties
name |
code |
description |
dataType |
valueType |
required |
Analysis Version |
ANALYSIS_VERSION |
Analysis Version |
string |
single |
False |
parameters
name |
code |
description |
dataType |
valueType |
required |
Resistance measurment |
RESISTANCE |
Resistance from test |
float |
single |
True |