ComponentType Structure for HCC Chip¶
Tables generated from PDB componentType data-strucutre
Types¶
| name | code | existing |
|---|---|---|
| HCC130 | HCC130 | True |
| HCCStarv0 | HCCSTAR | True |
| HCCStarv1 | HCCSTARV1 | True |
Properties¶
| name | code | description | required |
|---|---|---|---|
| eFuse ID Hex | EFUSE_HEX | eFuse ID (hex) | True |
| eFuse ID | EFUSE | eFuse ID (integer) | False |
| Chip Quality | QUALITY | Quality flag for the chip, with 0=failed, 1=passed, and 2+ being various levels of acceptable | False |
| Probe Location | PROBE_LOCATION | Location where probing occured | False |
| Number of Probe Attempts | N_PROBE_ATTEMPTS | Number of times this chip was probed | False |
| Final Probe Timestamp | FINAL_PROBE_TIMESTAMP | Timestamp for the final probing, from which data is taken (iso8601) | False |
| Wafer | WAFER_NAME | Wafer Identifier Code | False |
| Die Index | DIE_INDEX | Index of this chip on the Wafer die | False |
| Wafer X Position | WAFER_POS_X | Physical X position of this chip on the wafer die (uncalibrated microns) | False |
| Wafer Y Position | WAFER_POS_Y | Physical Y position of this chip on the wafer die (uncalibrated microns) | False |
| Pass Power Probing Test | PASS_POWER | If chip passed power tests during probing | False |
| Pass Digital Probing Test | PASS_DIGITAL | If chip passed digital readout tests during probing | False |
| Pass Analog Probing Test | PASS_ANALOG | If chip passed analog tests during probing | False |
| Optimal LDO Setting | OPTIMAL_LDO_SETTING | Chip LDO setting for optimal voltage (1.2V), as seen during probing | False |
| Optimal LDO Voltage | OPTIMAL_LDO_FMC_VDDREG | Voltage of optimal LDO setting, as seen during probing | False |
| Optimal LDO Raw Input Voltage | OPTIMAL_LDO_FMC_VDDRAW | Raw voltage when deriving optimal LDO setting, as seen during probing | False |
| Optimal Gain Setting | OPTIMAL_GAIN_SETTING | Chip setting to get optimal gain (1 count per mV), as seen during probing | False |
| Optimal Gain Slope | OPTIMAL_GAIN_SLOPE | Measured slope (counts/V) of optimal gain setting, as seen during probing | False |
| Optimal Gain Intercept | OPTIMAL_GAIN_INTERCEPT | Measured intercept (counts) of optimal gain setting, as seen during probing | False |
| Optimal Gain: Reduced Chi2 | OPTIMAL_GAIN_REDUCEDCHI2 | Reduced Chi2 of linear fit for optimal LDO setting, as seen during probing | False |
| Max LDO Setting | MAX_LDO_SETTING | Highest LDO setting at which maximum (plateau) LDO value is reached | False |
| Maximum Bandgap Voltage | MAX_LDO_FMC_VDDREG | Maximum bandgap value (at LDO setting of zero) | False |
| Startup Voltage | STARTUP_VOLTAGE | FMC regulated voltage on startup | False |
Flags¶
No flags found for object
Stages¶
Table¶
| name | code | order | alternative | initial | final |
|---|---|---|---|---|---|
| On Wafer | ON_WAFER | 0 | False | True | False |
| Probed | PROBED | 1 | True | False | False |
| Failed Visual Inspection | FAILED_VI | 2 | True | False | False |
| Category B | CATEGORY_B | 3 | True | False | False |
| Category T | CATEGORY_T | 4 | True | False | False |
| Category X | CATEGORY_X | 5 | True | False | False |
| On Single Chip Board | ON_SCB | 6 | True | False | False |
| Selected for bond pulling | BOND_PULLING | 7 | True | False | False |
| Category A | CATEGORY_A | 8 | False | False | True |
Mermaid Diagram¶
flowchart LR
subgraph Production Stages
subgraph "On Wafer"
a1["code: ON_WAFER"]
a2["tests:
"]
end
subgraph "Probed (alternative)"
b1["code: PROBED"]
b2["tests:
HCCProbe DCS Scan
HCCProbe Register Defaults
HCCProbe Digital HCCID Response
HCCProbe Digital Triggering
HCCProbe Digital Error Blocks
HCCProbe Digital Stuck Memory
HCCProbe Digital ABC Passthrough
HCCProbe Digital HCC Passthrough
HCCProbe LDO Scan
HCCProbe Calibration Scan
HCCProbe Digital External Resets
HCCProbe Digital Output Idles
HCCProbe Fuse ID
HCCProbe Digital Triplicated Clocks
HCCProbe Digital Shmoo Scan
HCCProbe Startup
"]
end
subgraph "Failed Visual Inspection (alternative)"
c1["code: FAILED_VI"]
c2["tests:
"]
end
subgraph "Category B (alternative)"
d1["code: CATEGORY_B"]
d2["tests:
"]
end
subgraph "Category T (alternative)"
e1["code: CATEGORY_T"]
e2["tests:
"]
end
subgraph "Category X (alternative)"
f1["code: CATEGORY_X"]
f2["tests:
"]
end
subgraph "On Single Chip Board (alternative)"
g1["code: ON_SCB"]
g2["tests:
Fast TID
"]
end
subgraph "Selected for bond pulling (alternative)"
h1["code: BOND_PULLING"]
h2["tests:
Pull Test
"]
end
end
subgraph Final Stages
subgraph "Category A"
i1["code: CATEGORY_A"]
i2["tests:
Visual Inspection
"]
end
end
Relatives¶
Parents¶
type: *
| name | code |
|---|---|
| Hybrid (Obsolete) | HYBRID |
| Hybrid (Obsolete) | HYBRID |
| Hybrid (Obsolete) | HYBRID |
| HCC Gelpack | HCC_GELPACK |
| ASIC Shipping Container | ASIC_SHIPPING_CONTAINER |
type: HCC130
| name | code |
|---|---|
| HCC Wafer | HCC_WAFER |
| Hybrid (Obsolete) | HYBRID |
| Hybrid (Obsolete) | HYBRID |
| Hybrid (Obsolete) | HYBRID |
| Hybrid (Obsolete) | HYBRID |
type: HCCSTAR
| name | code |
|---|---|
| HCC Wafer | HCC_WAFER |
| Mixed Wafer | MWAFER |
| Hybrid (Obsolete) | HYBRID |
| Hybrid (Obsolete) | HYBRID |
| Hybrid (Obsolete) | HYBRID |
| Hybrid (Obsolete) | HYBRID |
| Hybrid (Obsolete) | HYBRID |
| Hybrid (Obsolete) | HYBRID |
| Hybrid (Obsolete) | HYBRID |
| Hybrid (Obsolete) | HYBRID |
| Hybrid (Obsolete) | HYBRID |
| STAR Hybrid Assembly | HYBRID_ASSEMBLY |
| STAR Hybrid Assembly | HYBRID_ASSEMBLY |
| STAR Hybrid Assembly | HYBRID_ASSEMBLY |
| STAR Hybrid Assembly | HYBRID_ASSEMBLY |
| STAR Hybrid Assembly | HYBRID_ASSEMBLY |
| STAR Hybrid Assembly | HYBRID_ASSEMBLY |
| STAR Hybrid Assembly | HYBRID_ASSEMBLY |
| STAR Hybrid Assembly | HYBRID_ASSEMBLY |
| STAR Hybrid Assembly | HYBRID_ASSEMBLY |
| UofT Star Hybrid Assembly TestClone | UofT_Star_Hybrid_Assembly_TestClone |
type: HCCSTARV1
| name | code |
|---|---|
| STAR Hybrid Assembly | HYBRID_ASSEMBLY |
| STAR Hybrid Assembly | HYBRID_ASSEMBLY |
| STAR Hybrid Assembly | HYBRID_ASSEMBLY |
| STAR Hybrid Assembly | HYBRID_ASSEMBLY |
| STAR Hybrid Assembly | HYBRID_ASSEMBLY |
| STAR Hybrid Assembly | HYBRID_ASSEMBLY |
| STAR Hybrid Assembly | HYBRID_ASSEMBLY |
| STAR Hybrid Assembly | HYBRID_ASSEMBLY |
| STAR Hybrid Assembly | HYBRID_ASSEMBLY |
| STAR Hybrid Assembly | HYBRID_ASSEMBLY |
| STAR Hybrid Assembly | HYBRID_ASSEMBLY |
| UofT Star Hybrid Assembly TestClone | UofT_Star_Hybrid_Assembly_TestClone |
| Mixed Wafer | MWAFER |