TestType Structure for Sensor¶
Tables generated from PDB componentType data-strucutre
Tests Per Stage¶
stage code: REGISTERED¶
| test_name | test_code | test_order |
|---|---|---|
| Manufacturing Data ATLAS18 | MANUFACTURING18 | 1 |
stage code: SENS_TEST_STAGE¶
| test_name | test_code | test_order |
|---|---|---|
| ATLAS18 IV Test V1 | ATLAS18_IV_TEST_V1 | 9 |
| ATLAS18 CV Test V1 | ATLAS18_CV_TEST_V1 | 10 |
| ATLAS18 Current Stability V1 | ATLAS18_CURRENT_STABILITY_V1 | 11 |
| ATLAS18 Full Strip Std Test V1 | ATLAS18_FULLSTRIP_STD_V1 | 12 |
| ATLAS18 Shape Metrology V1 | ATLAS18_SHAPE_METROLOGY_V1 | 13 |
| ATLAS18 MAIN Thickness V1 | ATLAS18_MAIN_THICKNESS_V1 | 14 |
| ATLAS18 Full Strip KEK Test OLD V1 | ATLAS18_KEKTEST_OLD_V1 | 15 |
| ATLAS18 Full Strip KEK Test NEW V1 | ATLAS18_KEKTEST_NEW_V1 | 16 |
| ATLAS18 Visual Inspection V2 | ATLAS18_VIS_INSPECTION_V2 | 9 |
| ATLAS18 Handling Damage V1 | ATLAS18_HANDLING_DAMAGE_V1 | 10 |
| ATLAS18 Recovery V1 | ATLAS18_RECOVERY_V1 | 11 |
| ATLAS18 Special Use V1 | ATLAS18_SPECIAL_USE_V1 | 12 |
| ATLAS18 Fast Strip Std Test V1 | ATLAS18_FASTSTRIP_STD_V1 | 13 |
stage code: BLESSING¶
| test_name | test_code | test_order |
|---|---|---|
| ATLAS18 Approval V1 | ATLAS18_APPROVAL_V1 | 1 |
stage code: READY_FOR_MODULE¶
| test_name | test_code | test_order |
|---|---|---|
| ATLAS18 IV Test V1 | ATLAS18_IV_TEST_V1 | 1 |
| Visual Inspection Reception by Modules V2 | VIS_INSP_RES_MOD_V2 | 2 |
| ATLAS18 Handling Damage V1 | ATLAS18_HANDLING_DAMAGE_V1 | 3 |
| ATLAS18 Recovery V1 | ATLAS18_RECOVERY_V1 | 4 |
| ATLAS18 Special Use V1 | ATLAS18_SPECIAL_USE_V1 | 5 |
stage code: UNHAPPY¶
| test_name | test_code | test_order |
|---|---|---|
| ATLAS18 IV Test V1 | ATLAS18_IV_TEST_V1 | 1 |
| Visual Inspection Reception by Modules V2 | VIS_INSP_RES_MOD_V2 | 2 |
| ATLAS18 Handling Damage V1 | ATLAS18_HANDLING_DAMAGE_V1 | 3 |
| ATLAS18 Recovery V1 | ATLAS18_RECOVERY_V1 | 4 |
| ATLAS18 Special Use V1 | ATLAS18_SPECIAL_USE_V1 | 5 |
stage code: DAMAGED¶
| test_name | test_code | test_order |
|---|---|---|
| ATLAS18 IV Test V1 | ATLAS18_IV_TEST_V1 | 1 |
| Visual Inspection Reception by Modules V2 | VIS_INSP_RES_MOD_V2 | 2 |
| ATLAS18 Handling Damage V1 | ATLAS18_HANDLING_DAMAGE_V1 | 3 |
| ATLAS18 Recovery V1 | ATLAS18_RECOVERY_V1 | 4 |
| ATLAS18 Special Use V1 | ATLAS18_SPECIAL_USE_V1 | 5 |
stage code: PHANTOM¶
| test_name | test_code | test_order |
|---|---|---|
| nan | nan | nan |
stage code: SPECIAL_USE¶
| test_name | test_code | test_order |
|---|---|---|
| ATLAS18 IV Test V1 | ATLAS18_IV_TEST_V1 | 1 |
| Visual Inspection Reception by Modules V2 | VIS_INSP_RES_MOD_V2 | 2 |
| ATLAS18 Handling Damage V1 | ATLAS18_HANDLING_DAMAGE_V1 | 3 |
| ATLAS18 Recovery V1 | ATLAS18_RECOVERY_V1 | 4 |
| ATLAS18 Special Use V1 | ATLAS18_SPECIAL_USE_V1 | 5 |
stage code: RETURNED¶
| test_name | test_code | test_order |
|---|---|---|
| nan | nan | nan |
Test Details¶
test code: MANUFACTURING18¶
stages: REGISTERED
properties
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Date | DATE | Date of HPK testing | string | single | True |
| IV Temperature | IV_TEMPERATURE | Temperature during the IV (C) | float | single | True |
| IV Humidity | IV_HUMIDITY | Humidity during the IV (%) | float | single | True |
| IV Voltage Step | IV_VOLTAGE_STEP | Voltage step for IV (V) | float | single | True |
| IV Delay Time | IV_DELAY_TIME | Delay time for IV (s) | float | single | True |
| Substrate Lot Number | SUBSTRATE_LOT_NUMBER | Substrate lot number | string | single | True |
| Substrate Type | SUBSTRATE_TYPE | Substrate type | string | single | True |
| Substrate Orientation | SUBSTRATE_ORIENTATION | Substrate crystal orientation | string | single | True |
| Substrate Resistance (Upper) | SUBSTRATE_R_UPPER | Upper substrate resistance (kOhm*cm) | float | single | True |
| Substrate Resistance (Lower) | SUBSTRATE_R_LOWER | Lower substrate resistance (kOhm*cm) | float | single | True |
| Active Thickness | ACTIVE_THICKNESS | Substrate active thickness (um) | float | single | True |
parameters
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| IV Voltage | IV_VOLTAGE | Voltage values for IV (V) | float | array | True |
| IV Current | IV_CURRENT | Current values for IV (A) | float | array | True |
| Depletion Voltage | DEPLETION_VOLTAGE | Depletion voltage (V) | float | single | True |
| Leakage Current @ VFD + 50V | LEAKAGE_CURRENT_FD_PLUS_50V | Leakage current @ full depletion + 50V (uA) | float | single | True |
| Leakage Current @ 500V | LEAKAGE_CURRENT_500V | Leakage current @ 500V (uA) | float | single | True |
| Polysilicon Bias Resistance (Upper) | POLYSILICON_BIAS_R_UPPER | Upper polysilicon bias resistance (MOhm) | float | single | True |
| Polysilicon Bias Resistance (Lower) | POLYSILICON_BIAS_R_LOWER | Lower polysilicon bias resistance (MOhm) | float | single | True |
| Microdischarge Voltage | MICRODISCHARGE_VOLTAGE | Onset voltage of microdischarge (V) (== 700V := "over 700") | float | single | True |
| Current Stability 10s @ 700V | CURRENT_STABILITY_10S_700V | Current after 10s @ 700V (== 999 := "O.L." or "overloaded") | float | single | True |
| Current Stability 20s @ 700V | CURRENT_STABILITY_20S_700V | Current after 20s @ 700V (== 999 := "O.L." or "overloaded") | float | single | True |
| Current Stability 30s @ 700V | CURRENT_STABILITY_30S_700V | Current after 30s @ 700V (== 999 := "O.L." or "overloaded") | float | single | True |
test code: ATLAS18_IV_TEST_V1¶
stages: SENS_TEST_STAGE, READY_FOR_MODULE, UNHAPPY, DAMAGED, SPECIAL_USE
properties
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Vbias_SMU | VBIAS_SMU | Label for the SMU biasing the sensor | string | single | True |
| Rseries | RSERIES | [MOhm] Resistor value (in series with the sensor) | string | single | True |
| Test_DMM | TEST_DMM | DMM label (if applicable) | string | single | True |
| Rshunt | RSHUNT | [MOhm] shunt resistor (if applicable) | string | single | True |
| RunNumber | RUNNUMBER | test run number | integer | single | True |
| Comments | COMMENTS | test circumstances, etc | string | single | True |
| Algorithm_version | ALGORITHM_VERSION | derivation script version | string | single | True |
parameters
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Temperature | TEMPERATURE | [Celcius]` | float | single | True |
| I_500V | I_500V | [nA/cm^2] Derived value; =999 if N/A; thresholded | float | single | True |
| Shunt_voltage | SHUNT_VOLTAGE | [mV] non-zero only if shunt measurement | float | array | True |
| Humidity | HUMIDITY | [%] | float | single | True |
| Vbd | VBD | [V] Derived value; breakdown voltage | float | single | True |
| Current | CURRENT | [nA] | float | array | True |
| RMS_Stability | RMS_STABILITY | [nA] RMS of stability data if defined, else -1 | float | single | True |
| Voltage | VOLTAGE | [V] | float | array | True |
test code: ATLAS18_CV_TEST_V1¶
stages: SENS_TEST_STAGE
properties
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Vbias_SMU | VBIAS_SMU | (label) SMU for biasing sensors | string | single | True |
| Rseries | RSERIES | [MOhm] Series resistor in line with sensor | string | single | True |
| LCR | LCR | (label) LCR meter | string | single | True |
| Circuit | CIRCUIT | LCR Circuit config, e.g. "RC-series" | string | single | True |
| RunNumber | RUNNUMBER | test number | integer | single | True |
| Comments | COMMENTS | Test environment, etc | string | single | True |
| Algorithm_version | ALGORITHM_VERSION | Version of extraction/upload algorithm | string | single | True |
parameters
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Frequency | FREQUENCY | [kHz] LCR test frequency | string | single | True |
| Amplitude | AMPLITUDE | [V] LCR test amplitude | string | single | True |
| Temperature | TEMPERATURE | [Celcius] Test temperature | float | single | True |
| Humidity | HUMIDITY | [%] relative humidity | float | single | True |
| Voltage | VOLTAGE | [V] Bias voltage array | float | array | True |
| Capacitance | CAPACITANCE | [pF] Measured Capacitance | float | array | True |
| Resistance | RESISTANCE | [MOhm] Measured Resistance | float | array | True |
| Vfd | VFD | [V] Derived Full Depletion Voltage | float | single | True |
| Neff | NEFF | [1e12/cm^3] Derived effective doping | float | single | True |
| ActiveThickness | ACTIVETHICKNESS | [um] The active thickness (at full depletion) | float | single | True |
test code: ATLAS18_CURRENT_STABILITY_V1¶
stages: SENS_TEST_STAGE
properties
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Vbias_SMU | VBIAS_SMU | (label) Biasing SMU | string | single | True |
| Rseries | RSERIES | [MOhm] Resistance in series with sensor | string | single | True |
| Test_DMM | TEST_DMM | (label) if applicable, DMM for shut measurement | string | single | True |
| Rshunt | RSHUNT | [MOhm] (If applicable), shunt resitance | string | single | True |
| RunNumber | RUNNUMBER | Test iteration number | integer | single | True |
| Comments | COMMENTS | Test Environment, etc | string | single | True |
| Algorithm_version | ALGORITHM_VERSION | Version of the extraction/upload algorithm | string | single | True |
parameters
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Duration | DURATION | [h] Test time | string | single | True |
| Abs_I_leak_av | ABS_I_LEAK_AV | [nA] typical leakage current value | float | single | False |
| I_leak_variation | I_LEAK_VARIATION | RMS/average current | float | single | False |
| Vbias | VBIAS | [V] Bias voltage during the test | string | single | True |
| Time | TIME | [s] time since the test beginning | float | array | True |
| Temperature | TEMPERATURE | [Celcius] Temperature during the test | float | array | True |
| Humidity | HUMIDITY | [%] Humidity during the test | float | array | True |
| Current | CURRENT | [nA] Current measurement during the test | float | array | True |
| Shunt_voltage | SHUNT_VOLTAGE | [mV] (if applicable) shunt voltage measurements | float | array | True |
test code: ATLAS18_FULLSTRIP_STD_V1¶
stages: SENS_TEST_STAGE
properties
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Vbias_SMU | VBIAS_SMU | (label) SMU for biasing sensors | string | single | True |
| Rseries_bias | RSERIES | [MOhm] Series resistor for bias SMU | string | single | True |
| LCR | LCR | (label) LCR meter | string | single | True |
| Circuit | CIRCUIT | LCR Circuit config, e.g. "RC-series" | string | single | True |
| Test_SMU | TEST_SMU | (label) SMU for strip tests | string | single | True |
| RunNumber | RUNNUMBER | test number | integer | single | True |
| Comments | COMMENTS | Test environment, etc | string | single | True |
| Algorithm_version | ALGORITHM_VERSION | Version of extraction/upload algorithm | string | single | True |
| Rseries_test | RSERIES_TEST | [MOhm] Series resistor for test SMU | string | single | True |
parameters
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Frequency | FREQUENCY | [kHz] LCR test frequency | string | single | True |
| Capacitance | CAPACITANCE | [pF] Measured capacitance in the strip test | float | array | True |
| Current | CURRENT | [nA] measured current in the strip test | float | array | True |
| List_metal_short | LIST_METAL_SHORT | A list of strips with metal short (e.g. "1-133", "2-101", etc) | string | array | True |
| List_implant_break | LIST_IMPLANT_BREAK | A list of strips with implant break (e.g. "1-133", "2-101", etc) | string | array | True |
| List_pinholes | LIST_PINHOLES | A list of strips with pinholes (e.g. "1-133", "2-101", etc) | string | array | True |
| Resistance | RESISTANCE | [MOhm] Measured resistance in the strip test | float | array | True |
| ProbeIndex | PROBEINDEX | strip number in a segment | integer | array | True |
| Amplitude | AMPLITUDE | [V] LCR test amplitude | string | single | True |
| Vbias | VBIAS | [V] Bias voltage during the test | string | single | True |
| Temperature | TEMPERATURE | [Celcius] Temperature during the test | float | single | True |
| Humidity | HUMIDITY | [%] Humidity during the test | float | single | True |
| SegmentNo | SEGMENTNO | (1,...,4 for Barrrel; 0,...,3 for EC) Strip segment number under test | integer | single | True |
| List_open_resistor | LIST_OPEN_RESISTOR | A list of strips with open resistor (e.g. "1-133", "2-101", etc) | string | array | True |
| List_rbias_defect | LIST_RBIAS_DEFECT | List of strips with Rbias defect (e.g. "1-133", "2-101", etc) | string | array | True |
| N_badcluster_max | N_BADCLUSTER_MAX | [num.strips] Maximum length of a cluster with bad strips | integer | single | True |
| Bad_strip_fraction | BAD_STRIP_FRACTION | [%] a fraction of bad strips for this test | float | single | True |
| List_shorts | LIST_SHORTS | A list of strips with shorts detected at 10 V | string | array | True |
| NStrips | NSTRIPS | Number of strips in this segment | integer | single | False |
test code: ATLAS18_SHAPE_METROLOGY_V1¶
stages: SENS_TEST_STAGE
properties
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| CMM | CMM | (label) CMM machine in the test | string | single | True |
| Probe | PROBE | (label) probe in the test, e.g. "optical" | string | single | True |
| RunNumber | RUNNUMBER | Test iteration number | integer | single | True |
| Comments | COMMENTS | Test Environment, operator, etc | string | single | True |
| Algorithm_version | ALGORITHM_VERSION | Version of the extraction/upload algorithm | string | single | True |
parameters
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Temperature | TEMPERATURE | [Celcius] Temperature during the test | float | single | True |
| Humidity | HUMIDITY | [%] Humidity during the test | float | single | True |
| X | X | [mm] X axis coordinate | float | array | True |
| Y | Y | [mm] Y axis coordinates | float | array | True |
| Z | Z | [mm] Z axis coordinates | float | array | True |
| Z_bow | Z_BOW | [mm] Z after subtracting plane and coord shift | float | array | True |
| Bowing | BOWING | [um] Max-min from Z_bow | float | single | True |
test code: ATLAS18_MAIN_THICKNESS_V1¶
stages: SENS_TEST_STAGE
properties
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Instrument | INSTRUMENT | (label) Measurement Instrument | string | single | True |
| RunNumber | RUNNUMBER | Test iteration number | string | single | False |
| Comments | COMMENTS | Test Environment, operator, etc | string | single | True |
parameters
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| AvThickness | AVTHICKNESS | [um] Average sensor thickness | float | single | True |
test code: ATLAS18_KEKTEST_OLD_V1¶
stages: SENS_TEST_STAGE
properties
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Circuit | CIRCUIT | Type of circuit assumed by LCR meter | string | single | False |
| RunNumber | RUNNUMBER | Run number for the test | integer | single | False |
| Comments | COMMENTS | string | single | False |
parameters
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Amplitude | AMPLITUDE | [V] Amplitude of the LCR meter stimulus | string | single | True |
| ProbeIndex | PROBEINDEX | Probe index (really, a strip number for the probe test) | integer | array | True |
| Vbias_DC | VBIAS_DC | [V] Bias during the DC test | string | single | True |
| Vtest_DC | VTEST_DC | [V] Test voltage during DC test | string | single | True |
| Vbias_AC | VBIAS_AC | [V] Bias voltage during AC test | string | single | True |
| Tmeas | TMEAS | [ms] Measurement time after the instrument is turned on | string | single | True |
| SegmentNo | SEGMENTNO | Strip segment (row) number, starting from 1 | integer | single | True |
| Temperature | TEMPERATURE | [C] Measurement temperature | float | single | True |
| Humidity | HUMIDITY | [%] Relative Humidity | float | single | True |
| Current_DC | CURRENT_DC | [nA] Current measured during the DC test | float | array | True |
| Current_AC | CURRENT_AC | [nA] Current measured during the AC test | float | array | True |
test code: ATLAS18_KEKTEST_NEW_V1¶
stages: SENS_TEST_STAGE
properties
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Circuit | CIRCUIT | Type of circuit assumed by LCR meter | string | single | False |
| RunNumber | RUNNUMBER | Run number for the test | integer | single | False |
| Comments | COMMENTS | string | single | False |
parameters
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Amplitude | AMPLITUDE | [V] Amplitude of the LCR meter stimulus | string | single | True |
| SegmentNo | SEGMENTNO | Strip segment (row) number, starting from 1 | integer | single | True |
| Frequency | FREQUENCY | [kHz] LCR meter operational frequency | string | single | True |
| Vbias_DC | VBIAS_DC | [V] Bias during the DC test | string | single | True |
| Vtest_DC | VTEST_DC | [V] Test voltage during DC test | string | single | True |
| Vbias_AC | VBIAS_AC | [V] Bias voltage during AC test | string | single | True |
| Temperature | TEMPERATURE | [C] Measurement temperature | float | single | True |
| Humidity | HUMIDITY | [%] Relative Humidity | float | single | True |
| ProbeIndex | PROBEINDEX | Probe index (really, a strip number for the probe test) | integer | array | True |
| Current | CURRENT | [nA] Current measured during the DC test | float | array | True |
| Capacitance | CAPACITANCE | [pF] Capacitance measured during the AC test | float | array | True |
test code: ATLAS18_VIS_INSPECTION_V2¶
stages: SENS_TEST_STAGE
properties
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Comments | COMMENTS | Comments about the test environment/equipment/user | string | single | False |
| RunNumber | RUNNUMBER | Sequential test number | integer | single | False |
parameters
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Image Scratch pad | IMSCRATCHPAD | Image for the Scratch pad image (optional) | image | single | False |
| Location 1 | LOCATION1 | Location of defect 1 (optional) | string | single | False |
| Damage Type 1 | DAMAGE_TYPE1 | Damage Type of defect 1 (optional) | string | single | False |
| Defect 1 - Image 1 | IMS1_1 | Defect 1 - Image 1 (optional) | image | single | False |
| Defect 1 - Image 2 | IMS1_2 | Defect 1 - Image 2 (optional) | image | single | False |
| Defect 1 - Image 3 | IMS1_3 | Defect 1 - Image 3 (optional) | image | single | False |
| Defect 1 - Image 4 | IMS1_4 | Defect 1 - Image 4 (optional) | image | single | False |
| Location 2 | LOCATION2 | Location of defect 2 (optional) | string | single | False |
| Damage Type 2 | DAMAGE_TYPE2 | Damage Type of defect 2 (optional) | string | single | False |
| Defect 2 - Image 1 | IMS2_1 | Defect 2 - Image 1 (optional) | image | single | False |
| Defect 2 - Image 2 | IMS2_2 | Defect 2 - Image 2 (optional) | image | single | False |
| Defect 2 - Image 3 | IMS2_3 | Defect 2 - Image 3 (optional) | image | single | False |
| Defect 2 - Image 4 | IMS2_4 | Defect 2 - Image 4 (optional) | image | single | False |
| Location 3 | LOCATION3 | Location of defect 3 (optional) | string | single | False |
| Damage Type 3 | DAMAGE_TYPE3 | Damage Type of defect 3 (optional) | string | single | False |
| Defect 3 - Image 1 | IMS3_1 | Defect 3 - Image 1 (optional) | image | single | False |
| Defect 3 - Image 2 | IMS3_2 | Defect 3 - Image 2 (optional) | image | single | False |
| Defect 3 - Image 3 | IMS3_3 | Defect 3 - Image 3 (optional) | image | single | False |
| Defect 3 - Image 4 | IMS3_4 | Defect 3 - Image 4 (optional) | image | single | False |
| Location 4 | LOCATION4 | Location of defect 4 (optional) | string | single | False |
| Damage Type 4 | DAMAGE_TYPE4 | Damage Type of defect 4 (optional) | string | single | False |
| Defect 4 - Image 1 | IMS4_1 | Defect 4 - Image 1 (optional) | image | single | False |
| Defect 4 - Image 2 | IMS4_2 | Defect 4 - Image 2 (optional) | image | single | False |
| Defect 4 - Image 3 | IMS4_3 | Defect 4 - Image 3 (optional) | image | single | False |
| Defect 4 - Image 4 | IMS4_4 | Defect 4 - Image 4 (optional) | image | single | False |
| Location 5 | LOCATION5 | Location of defect 5 (optional) | string | single | False |
| Damage Type 5 | DAMAGE_TYPE5 | Damage Type of defect 5 (optional) | string | single | False |
| Defect 5 - Image 1 | IMS5_1 | Defect 5 - Image 1 (optional) | image | single | False |
| Defect 5 - Image 2 | IMS5_2 | Defect 5 - Image 2 (optional) | image | single | False |
| Defect 5 - Image 3 | IMS5_3 | Defect 5 - Image 3 (optional) | image | single | False |
| Defect 5 - Image 4 | IMS5_4 | Defect 5 - Image 4 (optional) | image | single | False |
| Location 6 | LOCATION6 | Location of defect 6 (optional) | string | single | False |
| Damage Type 6 | DAMAGE_TYPE6 | Damage Type of defect 6 (optional) | string | single | False |
| Defect 6 - Image 1 | IMS6_1 | Defect 6 - Image 1 (optional) | image | single | False |
| Defect 6 - Image 2 | IMS6_2 | Defect 6 - Image 2 (optional) | image | single | False |
| Defect 6 - Image 3 | IMS6_3 | Defect 6 - Image 3 (optional) | image | single | False |
| Defect 6 - Image 4 | IMS6_4 | Defect 6 - Image 4 (optional) | image | single | False |
test code: ATLAS18_HANDLING_DAMAGE_V1¶
stages: SENS_TEST_STAGE, READY_FOR_MODULE, UNHAPPY, DAMAGED, SPECIAL_USE
properties
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Comments | COMMENTS | Comments about the environment/equipment/user involved | string | single | False |
| RunNumber | RUNNUMBER | Sequential test number | integer | single | False |
parameters
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Result | RESULT | Result (either Pass or Fail (if the damage is fatal)) | string | single | True |
| Location | LOCATION | Location of damage on the sensor (optional) | string | single | False |
| Damage Type | DAMAGE_TYPE | Damage Type (optional) | string | single | False |
| Description | DESCRIPTION | Description (optional) | string | single | False |
test code: ATLAS18_RECOVERY_V1¶
stages: SENS_TEST_STAGE, READY_FOR_MODULE, UNHAPPY, DAMAGED, SPECIAL_USE
properties
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Comments | COMMENTS | Comments about the environment/equipment/user involved | string | single | False |
| RunNumber | RUNNUMBER | Sequential test number | integer | single | False |
| Instrument | INSTRUMENT | Instrument used | string | single | False |
parameters
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Method | METHOD | Recovery Method used - baking/dry storage/UV light | string | single | True |
| Temperature | TEMPERATURE | Temperature during the test (optional) | float | single | False |
| Duration | DURATION | The recovery duration [h] | float | single | False |
test code: ATLAS18_SPECIAL_USE_V1¶
stages: SENS_TEST_STAGE, READY_FOR_MODULE, UNHAPPY, DAMAGED, SPECIAL_USE
properties
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Comments | COMMENTS | Comments about the environment/equipment/user involved | string | single | False |
| RunNumber | RUNNUMBER | Sequential test number | integer | single | False |
parameters
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Description | DESCRIPTION | Description | string | single | True |
test code: ATLAS18_FASTSTRIP_STD_V1¶
stages: SENS_TEST_STAGE
properties
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Rseries_bias | RSERIES | [MOhm] Series resistor in line with bias SMU | string | single | True |
| Rseries_test | RSERIES_TEST | [MOhm] Series resistor in line with test SMU | string | single | True |
| Vbias_SMU | VBIAS_SMU | (label) SMU for biasing sensors | string | single | True |
| LCR | LCR | (label) LCR meter | string | single | True |
| Circuit | CIRCUIT | LCR Circuit config e.g. RC-series | string | single | True |
| Test_SMU | TEST_SMU | (label) SMU for strip tests | string | single | True |
| RunNumber | RUNNUMBER | test number | integer | single | True |
| Comments | COMMENTS | Test environment etc | string | single | True |
| Algorithm_version | ALGORITHM_VERSION | Version of extraction/upload algorithm | string | single | True |
parameters
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Frequency | FREQUENCY | [kHz] LCR test frequency | string | single | True |
| Amplitude | AMPLITUDE | [V] LCR test amplitude | string | single | True |
| Vbias | VBIAS | [V] Bias voltage during the test | string | single | True |
| Temperature | TEMPERATURE | [Celcius] Temperature during the test | float | single | True |
| Humidity | HUMIDITY | [%] Humidity during the test | float | single | True |
| SegmentNo | SEGMENTNO | (1...4) | integer | single | True |
| NStrips | NSTRIPS | Number of strips in the tested segment | integer | single | True |
| ProbeIndex | PROBEINDEX | strip number in a segment | integer | array | True |
| Current | CURRENT | [nA] measured current in the strip test | float | array | True |
| Capacitance | CAPACITANCE | [pF] Measured capacitance in the strip test | float | array | True |
| Resistance | RESISTANCE | [MOhm] Measured resistance in the strip test | float | array | True |
| List_shorts | LIST_SHORTS | List of shorts showing up at 10 V | string | array | True |
| List_pinholes | LIST_PINHOLES | A list of strips with pinholes | string | array | True |
| List_implant_break | LIST_IMPLANT_BREAK | A list of strips with implant break | string | array | True |
| List_metal_short | LIST_METAL_SHORT | A list of strips with metal short | string | array | True |
| List_open_resistor | LIST_OPEN_RESISTOR | A list of strips with open resistor | string | array | True |
| List_rbias_defect | LIST_RBIAS_DEFECT | List of strips with Rbias defect | string | array | True |
| N_badcluster_max_fast | N_BADCLUSTER_MAX_FAST | [num.strips] Max bad strips cluster length | integer | single | True |
| Bad_strip_fraction_fast | BAD_STRIP_FRACTION_FAST | [%] a fraction of bad strips for this test | float | single | True |
| Bad_strip_fraction_resist_fast | BAD_STRIP_FRACTION_RESIST_FAST | [%] a fraction of bad strips (extrapolating using resistances) for this test | float | single | True |
test code: ATLAS18_APPROVAL_V1¶
stages: BLESSING
properties
NB required flag missing
parameters
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Reception Date | RDATE | The orig. reception date | string | single | False |
| kekPass | KEKPASS | If the tests above were ok | boolean | single | False |
| Golden Wafer | GOLDEN_WAFER | Golden if True | boolean | single | False |
| Fully Tested | FULLY_TESTED | If necessary tests done | boolean | single | False |
| Tested At | TESTED_AT | Test sites for this sensor | string | single | False |
| hpkID | HPKID | Test ID | string | single | False |
| hpkPass | HPKPASS | If the test above was ok | boolean | single | False |
| ingot | INGOT | aka SUBSTRATE_LOT_NUMBER | string | single | False |
| hpkVfd | HPKVFD | Full depletion in HPK test | float | single | False |
| hpkMaxNBad | HPKMAXNBAD | Maximal bad cluster length | integer | single | False |
| hpkBadPerc | HPKBADPERC | [%] fraction of bad strips | float | single | False |
| inspecID | INSPECID | Test ID | string | single | False |
| inspecPass | INSPECPASS | If the test above was ok | boolean | single | False |
| inspecDmg | INSPECDMG | Visual features observed | string | single | False |
| ivID | IVID | Test ID | string | single | False |
| ivPass | IVPASS | If the test above was ok | boolean | single | False |
| I500V | I500V | [nA/cm^2] Ileak at 500V | float | single | False |
| Vbd | VBD | Breakdown voltage | float | single | False |
| RMS700V | RMS700V | RMS of current at 700V | float | single | False |
| cvID | CVID | Test ID | string | single | False |
| cvPass | CVPASS | If the test above was ok | boolean | single | False |
| Vfd | VFD | Full depletion voltage | float | single | False |
| Neff | NEFF | [1e12/cm^3] Eff. bulk conc | float | single | False |
| actThick | ACTTHICK | [um] Active thickness | float | single | False |
| stabID | STABID | Test ID | string | single | False |
| stabPass | STABPASS | If the test above was ok | boolean | single | False |
| stabIleak | STABILEAK | [nA] Abs(current) (T-corr) | float | single | False |
| stabIvar | STABIVAR | Var/Av for Ileak (T-corr) | float | single | False |
| fullstripID | FULLSTRIPID | Test IDs | string | array | False |
| fullStripPass | FULLSTRIPPASS | If the tests above were ok | boolean | single | False |
| segmentNo | SEGMENTNO | Tested segment numbers | integer | array | False |
| atlNbadSeq | ATLNBADSEQ | Maximum bad strip clusters | integer | array | False |
| atlNbadFrac | ATLNBADFRAC | Fractions of bad strips | float | array | False |
| shapeID | SHAPEID | Test ID | string | single | False |
| shapePass | SHAPEPASS | If the test above was ok | boolean | single | False |
| Bow | BOW | The sensor shape bow | float | single | False |
| thickID | THICKID | Test ID | string | single | False |
| thickPass | THICKPASS | If the test above was ok | boolean | single | False |
| Thickness | TH | [um] The wafer thickness | float | single | False |
| kekID | KEKID | Test IDs | string | array | False |
| kekSegNo | KEKSEGNO | Tested segment numbers | integer | array | False |
| handleID | HANDLEID | Test ID | string | single | False |
| handlePass | HANDLEPASS | If the test above was ok | boolean | single | False |
| handleDamage | HANDLEDAMAGE | Handling damage descr. | string | single | False |
| recovID | RECOVID | Test ID | string | single | False |
| recovPass | RECOVPASS | If the test above was ok | boolean | single | False |
| recovMeth | RECOVMETH | The recovery method used | string | single | False |
| specUseID | SPECUSEID | Test ID | string | single | False |
| specUsePass | SPECUSEPASS | If the test above was ok | boolean | single | False |
| specUseDescr | SPECUSEDESCR | Special use Description | string | single | False |
| QATC_OK | QATC_OK | If QA-TC tests are ok | boolean | single | False |
| QACCE_OK | QACCE_OK | If QA-CCE tests are ok | boolean | single | False |
| finalStage | FINALSTAGE | Final stage sensor sent to | string | single | False |
| Decision comment | COMMENT | Comment on the decision | string | single | False |
| SoftVersion | SOFTVERSION | Software version used | string | single | False |
test code: VIS_INSP_RES_MOD_V2¶
stages: READY_FOR_MODULE, UNHAPPY, DAMAGED, SPECIAL_USE
properties
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Comments | COMMENTS | Comments about the test environment/equipment/user | string | single | False |
| RunNumber | RUNNUMBER | Sequential test number | integer | single | False |
parameters
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| URL Scratch pad | URLSCRATCHPAD | URL for the Scratch pad image (optional) | string | single | False |
| Location 1 | LOCATION1 | Location of defect 1 (optional) | string | single | False |
| Damage Type 1 | DAMAGE_TYPE1 | Damage Type of defect 1 (optional) | string | single | False |
| URLs for Defect 1 | URLS1 | URL links for defect 1 images (optional) | string | array | False |
| Location 2 | LOCATION2 | Location of defect 2 (optional) | string | single | False |
| Damage Type 2 | DAMAGE_TYPE2 | Damage Type of defect 2 (optional) | string | single | False |
| URLs for Defect 2 | URLS2 | URL links for defect 2 images (optional) | string | array | False |
| Location 3 | LOCATION3 | Location of defect 3 (optional) | string | single | False |
| Damage Type 3 | DAMAGE_TYPE3 | Damage Type of defect 3 (optional) | string | single | False |
| URLs for Defect 3 | URLS3 | URL links for defect 3 images (optional) | string | array | False |
| Location 4 | LOCATION4 | Location of defect 4 (optional) | string | single | False |
| Damage Type 4 | DAMAGE_TYPE4 | Damage Type of defect 4 (optional) | string | single | False |
| URLs for Defect 4 | URLS4 | URL links for defect 4 images (optional) | string | array | False |
| Location 5 | LOCATION5 | Location of defect 5 (optional) | string | single | False |
| Damage Type 5 | DAMAGE_TYPE5 | Damage Type of defect 5 (optional) | string | single | False |
| URLs for Defect 5 | URLS5 | URL links for defect 5 images (optional) | string | array | False |
| Location 6 | LOCATION6 | Location of defect 6 (optional) | string | single | False |
| Damage Type 6 | DAMAGE_TYPE6 | Damage Type of defect 6 (optional) | string | single | False |
| URLs for Defect 6 | URLS6 | URL links for defect 6 images (optional) | string | array | False |