TestType Structure for HCC Chip¶
Tables generated from PDB componentType data-strucutre
Tests Per Stage¶
stage code: ON_WAFER¶
| test_name | test_code | test_order |
|---|---|---|
| nan | nan | nan |
stage code: PROBED¶
| test_name | test_code | test_order |
|---|---|---|
| HCCProbe DCS Scan | HCCProbe_DCSScan | 0 |
| HCCProbe Register Defaults | HCCProbe_Digital_RegisterDefaults | 1 |
| HCCProbe Digital HCCID Response | HCCProbe_Digital_HCCIDResponse | 2 |
| HCCProbe Digital Triggering | HCCProbe_Digital_Triggering | 3 |
| HCCProbe Digital Error Blocks | HCCProbe_Digital_ErrorBlocks | 4 |
| HCCProbe Digital Stuck Memory | HCCProbe_Digital_StuckMemory | 5 |
| HCCProbe Digital ABC Passthrough | HCCProbe_Digital_ABCPassthrough | 6 |
| HCCProbe Digital HCC Passthrough | HCCProbe_Digital_HCCPassthrough | 7 |
| HCCProbe LDO Scan | HCCProbe_LDOScan | 8 |
| HCCProbe Calibration Scan | HCCProbe_CalibrationScan | 9 |
| HCCProbe Digital External Resets | HCCProbe_Digital_ExternalResets | 10 |
| HCCProbe Digital Output Idles | HCCProbe_Digital_OutputIdles | 11 |
| HCCProbe Fuse ID | HCCProbe_FuseID | 12 |
| HCCProbe Digital Triplicated Clocks | HCCProbe_Digital_TriplicatedClocks | 13 |
| HCCProbe Digital Shmoo Scan | HCCProbe_Digital_ShmooScan | 14 |
| HCCProbe Startup | HCCProbe_Startup | 15 |
stage code: FAILED_VI¶
| test_name | test_code | test_order |
|---|---|---|
| nan | nan | nan |
stage code: CATEGORY_B¶
| test_name | test_code | test_order |
|---|---|---|
| nan | nan | nan |
stage code: CATEGORY_T¶
| test_name | test_code | test_order |
|---|---|---|
| nan | nan | nan |
stage code: CATEGORY_X¶
| test_name | test_code | test_order |
|---|---|---|
| nan | nan | nan |
stage code: ON_SCB¶
| test_name | test_code | test_order |
|---|---|---|
| Fast TID | FAST_TID | 1 |
stage code: BOND_PULLING¶
| test_name | test_code | test_order |
|---|---|---|
| Pull Test | PULL_TEST | 0 |
stage code: CATEGORY_A¶
| test_name | test_code | test_order |
|---|---|---|
| Visual Inspection | VISUAL_INSPECTION | 1 |
Test Details¶
test code: HCCProbe_DCSScan¶
stages: PROBED
properties
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Probe Location | PROBE_LOCATION | Location where this test was performed | string | single | False |
| Wafer name | WAFER_NAME | Name of the wafer | string | single | False |
| Die Index | DIE_INDEX | Positional index on the Wafer Die | integer | single | False |
| Wafer X Position | WAFER_POS_X | Physical X position of this chip on the wafer die | integer | single | False |
| Wafer Y Position | WAFER_POS_Y | Physical Y position of this chip on the wafer die | integer | single | False |
| AM Gain Setting | AM_GAIN | Value of the Analog Monitor Gain Setting for the entire test | integer | single | False |
| Probe Test Order Index | TEST_ORDER | Index of this test within probe test suite | integer | single | True |
| X-axis Variable | XNAME | Name of the variable used in the test scan for the x-axis | string | single | True |
| eFuse ID Hex | EFUSE_HEX | eFuse ID (hex) | string | single | True |
| eFuse ID | EFUSE | eFuse ID (integer) | integer | single | True |
| Software Info | SW_INFO | Dictionary of information related to ITSDAQ software | object | single | False |
| Probestation Name | PROBESTATION | Name of Probestation | string | single | False |
| Host computer name | HOST | Name of computer used for probing | string | single | False |
| User names | USER | Person(s) performing the Probe tests | string | single | False |
| FMC Hardware Name | FMC | Name of the FMC hardware used for probing | string | single | False |
| FMC Firmware Version | FIRMWARE_REVISION | Version of the firmware used on the FMC for probing | string | single | False |
| Calibration Slope Set | CAL_SLOPE_SET | Calibrated value of the AM slope | float | single | False |
| Calibration Offset Set | CAL_OFFSET_SET | Calibrated value of the AM offset | float | single | False |
parameters
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| AM Temp (calc) | AM_TEMP_CALC | Analog Monitor Temperature (calculated, volts) | float | array | True |
| AM VDD Reg (calc) | AM_VDDREG_CALC | Analog Monitor VDD Reg Voltage (calculated) | float | array | True |
| AM Hybrid Ground (calc) | AM_HYBGND_CALC | Analog Monitor Hybrid Ground Voltage (calculated) | float | array | True |
| Data Clock Line current | HCCPAD_DATACLK_TOSTAVE_CURRENT | Data Clock line from HCC to Stave for debugging (A) | float | array | True |
| R3L1 Repeater current | HCCPAD_R3L1_REPEATER_CURRENT | HCC R3L1 Repeater line from one HCC to another (A) | float | array | True |
| Test Quality | QUALITY | 1 if this chip passed, else 0 | integer | single | True |
| Failure Messages | FAILURE_MESSAGES | List of failure messages | string | array | True |
| FMC Bandgap | FMC_BANDGAP | FMC Bandgap Voltage (V) | float | array | True |
| FMC NTC0 Temperature | FMC_NTC0 | FMC NTC0 Temperature (Celsius) | float | array | True |
| AM Bandgap | AM_BANDGAP | Analog Monitor Bandgap Voltage (counts) | integer | array | True |
| AM Temperature | AM_TEMP | Analog Monitor Temperature (counts) | integer | array | True |
| AM VDD Reg | AM_VDDREG | Analog Monitor VDD Reg Voltage (counts) | integer | array | True |
| AM VDD Raw | AM_VDDRAW | Analog Monitor VDD Raw Voltage (counts) | integer | array | True |
| DATA Line | HCCPAD_DATA_TOSTAVE | Data Line from HCC to Stave (V) | float | array | True |
| Data Clock Line | HCCPAD_DATACLK_TOSTAVE | Data Clock line from HCC to Stave for debugging (V) | float | array | True |
| R3L1 Repeater | HCCPAD_R3L1_REPEATER | HCC R3L1 Repeater line from one HCC to another (V) | float | array | True |
| LCB Repeater | HCCPAD_LCB_REPEATER | HCC LCB Repeater line from one HCC to another (V) | float | array | True |
| BTC Repeater | HCCPAD_BTC_REPEATER | HCC BTC Repeater line from one HCC to another (V) | float | array | True |
| RClock to ABC | HCCPAD_RCLK_TOABC | RClock HYB line from HCC to ABC (V) | float | array | True |
| LCB to ABC | HCCPAD_LCB_TOABC | LCB HYB line from HCC to ABC (V) | float | array | True |
| BC to ABC | HCCPAD_BC_TOABC | BC HYB line from HCC to ABC (V) | float | array | True |
| PRLP to ABC | HCCPAD_PRLP_TOABC | PRLP HYB line from HCC to ABC (V) | float | array | True |
| R3L1 HCC input | HCCPAD_R3L1_FROMSTAVE | R3L1 line from the Stave to the HCC (V) | float | array | True |
| LCB HCC input | HCCPAD_LCB_FROMSTAVE | LCB line from the Stave to the HCC (V) | float | array | True |
| FMC VDD Raw | FMC_VDDRAW | FMC VDD Raw Voltage (V) | float | array | True |
| FMC VDD Reg | FMC_VDDREG | FMC VDD Reg Voltage (V) | float | array | True |
| FMC IDD | FMC_IDD | FMC IDD Current (mA) | float | array | True |
| FMC VDD | FMC_VDD | FMC VDD Voltage (V) | float | array | True |
| AM Hybrid Ground | AM_HYBGND | Analog Monitor Hybrid Ground Voltage (counts) | float | array | True |
| AM Calibration Voltage | AM_CAL | AM Input Calibration Voltage (counts) | integer | array | True |
| BTC HCC input | HCCPAD_BTC_FROMSTAVE | BTC line from the Stave to the HCC (V) | float | array | True |
| AM Bandgap (calc) | AM_BANDGAP_CALC | Analog Monitor Bandgap Voltage (calculated) | float | array | True |
| AM VDD Raw (calc) | AM_VDDRAW_CALC | Analog Monitor VDD Raw Voltage (calculated) | float | array | True |
| DATA Line current | HCCPAD_DATA_TOSTAVE_CURRENT | Data Line from HCC to Stave (A) | float | array | True |
| LCB Repeater current | HCCPAD_LCB_REPEATER_CURRENT | HCC LCB Repeater line from one HCC to another (A) | float | array | True |
| BTC Repeater current | HCCPAD_BTC_REPEATER_CURRENT | HCC BTC Repeater line from one HCC to another (A) | float | array | True |
| RClock to ABC current | HCCPAD_RCLK_TOABC_CURRENT | RClock HYB line from HCC to ABC (A) | float | array | True |
| LCB to ABC current | HCCPAD_LCB_TOABC_CURRENT | LCB HYB line from HCC to ABC (A) | float | array | True |
| BC to ABC current | HCCPAD_BC_TOABC_CURRENT | BC HYB line from HCC to ABC (A) | float | array | True |
| PRLP to ABC current | HCCPAD_PRLP_TOABC_CURRENT | PRLP HYB line from HCC to ABC (A) | float | array | True |
| AM Calibration Voltage (calc) | AM_CAL_CALC | AM Input Calibration Voltage | float | array | True |
| Clocks Off Flag | CLOCKS_OFF | Flag for clocks off mode, one entry for each data point collected | integer | array | True |
| Current Setting | CURRENT_SETTING | Setting of the CMV current for each data point collected | integer | array | True |
| Low Power Mode Flag | LOW_POWER | Flag for low power mode, one entry for each data point taken | integer | array | True |
test code: HCCProbe_Digital_RegisterDefaults¶
stages: PROBED
properties
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| eFuse ID Hex | EFUSE_HEX | eFuse ID (hex) | string | single | True |
| eFuse ID | EFUSE | eFuse ID (integer) | integer | single | True |
| Probe Test Order Index | TEST_ORDER | Index of this test within probe test suite | integer | single | True |
| Probe Location | PROBE_LOCATION | Location where this test was performed | string | single | True |
| Wafer name | WAFER_NAME | Name of the wafer | string | single | True |
| Die Index | DIE_INDEX | Positional index on the Wafer Die | integer | single | True |
| Wafer X Position | WAFER_POS_X | Physical X position of this chip on the wafer die | integer | single | True |
| Wafer Y Position | WAFER_POS_Y | Physical Y position of this chip on the wafer die | integer | single | True |
| Software Info | SW_INFO | Dictionary of information related to ITSDAQ software | object | single | False |
| Probestation Name | PROBESTATION | Name of Probestation | string | single | False |
| Host computer name | HOST | Name of computer used for probing | string | single | False |
| User names | USER | Person(s) performing the Probe tests | string | single | False |
| FMC Hardware Name | FMC | Name of the FMC hardware used for probing | string | single | False |
| FMC Firmware Version | FIRMWARE_REVISION | Version of the firmware used on the FMC for probing | string | single | False |
parameters
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Test Quality | QUALITY | 1 if this chip passed, else 0 | integer | single | True |
| Failure Messages | FAILURE_MESSAGES | List of failure messages | string | array | True |
| List of 1st attempt test failures | TEST_RETRIES | List of tests that failed the 1st attempt, before the automatic retry | string | array | True |
test code: HCCProbe_Digital_HCCIDResponse¶
stages: PROBED
properties
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| eFuse ID Hex | EFUSE_HEX | eFuse ID (hex) | string | single | True |
| eFuse ID | EFUSE | eFuse ID (integer) | integer | single | True |
| Probe Test Order Index | TEST_ORDER | Index of this test within probe test suite | integer | single | True |
| Probe Location | PROBE_LOCATION | Location where this test was performed | string | single | True |
| Wafer name | WAFER_NAME | Name of the wafer | string | single | True |
| Die Index | DIE_INDEX | Positional index on the Wafer Die | integer | single | True |
| Wafer X Position | WAFER_POS_X | Physical X position of this chip on the wafer die | integer | single | True |
| Wafer Y Position | WAFER_POS_Y | Physical Y position of this chip on the wafer die | integer | single | True |
| Software Info | SW_INFO | Dictionary of information related to ITSDAQ software | object | single | False |
| Probestation Name | PROBESTATION | Name of Probestation | string | single | False |
| Host computer name | HOST | Name of computer used for probing | string | single | False |
| User names | USER | Person(s) performing the Probe tests | string | single | False |
| FMC Hardware Name | FMC | Name of the FMC hardware used for probing | string | single | False |
| FMC Firmware Version | FIRMWARE_REVISION | Version of the firmware used on the FMC for probing | string | single | False |
parameters
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Test Quality | QUALITY | 1 if this chip passed, else 0 | integer | single | |
| Failure Messages | FAILURE_MESSAGES | List of failure messages | string | array | |
| List of 1st attempt test failures | TEST_RETRIES | List of tests that failed the 1st attempt, before the automatic retry | string | array |
test code: HCCProbe_Digital_Triggering¶
stages: PROBED
properties
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| eFuse ID Hex | EFUSE_HEX | eFuse ID (hex) | string | single | True |
| eFuse ID | EFUSE | eFuse ID (integer) | integer | single | True |
| Probe Test Order Index | TEST_ORDER | Index of this test within probe test suite | integer | single | True |
| Probe Location | PROBE_LOCATION | Location where this test was performed | string | single | True |
| Wafer name | WAFER_NAME | Name of the wafer | string | single | True |
| Die Index | DIE_INDEX | Positional index on the Wafer Die | integer | single | True |
| Wafer X Position | WAFER_POS_X | Physical X position of this chip on the wafer die | integer | single | True |
| Wafer Y Position | WAFER_POS_Y | Physical Y position of this chip on the wafer die | integer | single | True |
| Software Info | SW_INFO | Dictionary of information related to ITSDAQ software | object | single | False |
| Probestation Name | PROBESTATION | Name of Probestation | string | single | False |
| Host computer name | HOST | Name of computer used for probing | string | single | False |
| User names | USER | Person(s) performing the Probe tests | string | single | False |
| FMC Hardware Name | FMC | Name of the FMC hardware used for probing | string | single | False |
| FMC Firmware Version | FIRMWARE_REVISION | Version of the firmware used on the FMC for probing | string | single | False |
parameters
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Test Quality | QUALITY | 1 if this chip passed, else 0 | integer | single | |
| Failure Messages | FAILURE_MESSAGES | List of failure messages | string | array | |
| List of 1st attempt test failures | TEST_RETRIES | List of tests that failed the 1st attempt, before the automatic retry | string | array |
test code: HCCProbe_Digital_ErrorBlocks¶
stages: PROBED
properties
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| eFuse ID Hex | EFUSE_HEX | eFuse ID (hex) | string | single | True |
| eFuse ID | EFUSE | eFuse ID (integer) | integer | single | True |
| Probe Test Order Index | TEST_ORDER | Index of this test within probe test suite | integer | single | True |
| Probe Location | PROBE_LOCATION | Location where this test was performed | string | single | True |
| Wafer name | WAFER_NAME | Name of the wafer | string | single | True |
| Die Index | DIE_INDEX | Positional index on the Wafer Die | integer | single | True |
| Wafer X Position | WAFER_POS_X | Physical X position of this chip on the wafer die | integer | single | True |
| Wafer Y Position | WAFER_POS_Y | Physical Y position of this chip on the wafer die | integer | single | True |
| Software Info | SW_INFO | Dictionary of information related to ITSDAQ software | object | single | False |
| Probestation Name | PROBESTATION | Name of Probestation | string | single | False |
| Host computer name | HOST | Name of computer used for probing | string | single | False |
| User names | USER | Person(s) performing the Probe tests | string | single | False |
| FMC Hardware Name | FMC | Name of the FMC hardware used for probing | string | single | False |
| FMC Firmware Version | FIRMWARE_REVISION | Version of the firmware used on the FMC for probing | string | single | False |
parameters
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Test Quality | QUALITY | 1 if this chip passed, else 0 | integer | single | |
| Failure Messages | FAILURE_MESSAGES | List of failure messages | string | array | |
| List of 1st attempt test failures | TEST_RETRIES | List of tests that failed the 1st attempt, before the automatic retry | string | array |
test code: HCCProbe_Digital_StuckMemory¶
stages: PROBED
properties
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| eFuse ID Hex | EFUSE_HEX | eFuse ID (hex) | string | single | True |
| eFuse ID | EFUSE | eFuse ID (integer) | integer | single | True |
| Probe Test Order Index | TEST_ORDER | Index of this test within probe test suite | integer | single | True |
| Probe Location | PROBE_LOCATION | Location where this test was performed | string | single | True |
| Wafer name | WAFER_NAME | Name of the wafer | string | single | True |
| Die Index | DIE_INDEX | Positional index on the Wafer Die | integer | single | True |
| Wafer X Position | WAFER_POS_X | Physical X position of this chip on the wafer die | integer | single | True |
| Wafer Y Position | WAFER_POS_Y | Physical Y position of this chip on the wafer die | integer | single | True |
| Software Info | SW_INFO | Dictionary of information related to ITSDAQ software | object | single | False |
| Probestation Name | PROBESTATION | Name of Probestation | string | single | False |
| Host computer name | HOST | Name of computer used for probing | string | single | False |
| User names | USER | Person(s) performing the Probe tests | string | single | False |
| FMC Hardware Name | FMC | Name of the FMC hardware used for probing | string | single | False |
| FMC Firmware Version | FIRMWARE_REVISION | Version of the firmware used on the FMC for probing | string | single | False |
parameters
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Test Quality | QUALITY | 1 if this chip passed, else 0 | integer | single | |
| Failure Messages | FAILURE_MESSAGES | List of failure messages | string | array | |
| List of 1st attempt test failures | TEST_RETRIES | List of tests that failed the 1st attempt, before the automatic retry | string | array |
test code: HCCProbe_Digital_ABCPassthrough¶
stages: PROBED
properties
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| eFuse ID Hex | EFUSE_HEX | eFuse ID (hex) | string | single | True |
| eFuse ID | EFUSE | eFuse ID (integer) | integer | single | True |
| Probe Test Order Index | TEST_ORDER | Index of this test within probe test suite | integer | single | True |
| Probe Location | PROBE_LOCATION | Location where this test was performed | string | single | True |
| Wafer name | WAFER_NAME | Name of the wafer | string | single | True |
| Die Index | DIE_INDEX | Positional index on the Wafer Die | integer | single | True |
| Wafer X Position | WAFER_POS_X | Physical X position of this chip on the wafer die | integer | single | True |
| Wafer Y Position | WAFER_POS_Y | Physical Y position of this chip on the wafer die | integer | single | True |
| Software Info | SW_INFO | Dictionary of information related to ITSDAQ software | object | single | False |
| Probestation Name | PROBESTATION | Name of Probestation | string | single | False |
| Host computer name | HOST | Name of computer used for probing | string | single | False |
| User names | USER | Person(s) performing the Probe tests | string | single | False |
| FMC Hardware Name | FMC | Name of the FMC hardware used for probing | string | single | False |
| FMC Firmware Version | FIRMWARE_REVISION | Version of the firmware used on the FMC for probing | string | single | False |
parameters
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Test Quality | QUALITY | 1 if this chip passed, else 0 | integer | single | |
| Failure Messages | FAILURE_MESSAGES | List of failure messages | string | array | |
| List of 1st attempt test failures | TEST_RETRIES | List of tests that failed the 1st attempt, before the automatic retry | string | array |
test code: HCCProbe_Digital_HCCPassthrough¶
stages: PROBED
properties
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| eFuse ID Hex | EFUSE_HEX | eFuse ID (hex) | string | single | True |
| eFuse ID | EFUSE | eFuse ID (integer) | integer | single | True |
| Probe Test Order Index | TEST_ORDER | Index of this test within probe test suite | integer | single | True |
| Probe Location | PROBE_LOCATION | Location where this test was performed | string | single | True |
| Wafer name | WAFER_NAME | Name of the wafer | string | single | True |
| Die Index | DIE_INDEX | Positional index on the Wafer Die | integer | single | True |
| Wafer X Position | WAFER_POS_X | Physical X position of this chip on the wafer die | integer | single | True |
| Wafer Y Position | WAFER_POS_Y | Physical Y position of this chip on the wafer die | integer | single | True |
| Software Info | SW_INFO | Dictionary of information related to ITSDAQ software | object | single | False |
| Probestation Name | PROBESTATION | Name of Probestation | string | single | False |
| Host computer name | HOST | Name of computer used for probing | string | single | False |
| User names | USER | Person(s) performing the Probe tests | string | single | False |
| FMC Hardware Name | FMC | Name of the FMC hardware used for probing | string | single | False |
| FMC Firmware Version | FIRMWARE_REVISION | Version of the firmware used on the FMC for probing | string | single | False |
parameters
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Test Quality | QUALITY | 1 if this chip passed, else 0 | integer | single | |
| Failure Messages | FAILURE_MESSAGES | List of failure messages | string | array | |
| List of 1st attempt test failures | TEST_RETRIES | List of tests that failed the 1st attempt, before the automatic retry | string | array |
test code: HCCProbe_LDOScan¶
stages: PROBED
properties
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Probe Location | PROBE_LOCATION | Location where this test was performed | string | single | False |
| Wafer name | WAFER_NAME | Name of the wafer | string | single | False |
| Die Index | DIE_INDEX | Positional index on the Wafer Die | integer | single | False |
| Wafer X Position | WAFER_POS_X | Physical X position of this chip on the wafer die | integer | single | False |
| Wafer Y Position | WAFER_POS_Y | Physical Y position of this chip on the wafer die | integer | single | False |
| AM Gain Setting | AM_GAIN | Value of the Analog Monitor Gain Setting for the entire test | integer | single | False |
| Probe Test Order Index | TEST_ORDER | Index of this test within probe test suite | integer | single | True |
| X-axis Variable | XNAME | Name of the variable used in the test scan for the x-axis | string | single | True |
| eFuse ID Hex | EFUSE_HEX | eFuse ID (hex) | string | single | True |
| eFuse ID | EFUSE | eFuse ID (integer) | integer | single | True |
| Software Info | SW_INFO | Dictionary of information related to ITSDAQ software | object | single | False |
| Probestation Name | PROBESTATION | Name of Probestation | string | single | False |
| Host computer name | HOST | Name of computer used for probing | string | single | False |
| User names | USER | Person(s) performing the Probe tests | string | single | False |
| FMC Hardware Name | FMC | Name of the FMC hardware used for probing | string | single | False |
| FMC Firmware Version | FIRMWARE_REVISION | Version of the firmware used on the FMC for probing | string | single | False |
| Calibration Slope Set | CAL_SLOPE_SET | Calibrated value of the AM slope | float | single | False |
| Calibration Offset Set | CAL_OFFSET_SET | Calibrated value of the AM offset | float | single | False |
parameters
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| VDD Raw for Optimal LDO setting | OPTIMAL_LDO_FMC_VDDRAW | Input VDD Raw voltage when calculating optimal LDO setting (V) | float | single | True |
| Optimal LDO Voltage | OPTIMAL_LDO_FMC_VDDREG | Voltage of optimal LDO setting, as seen during probing (V) | float | single | True |
| FMC VDD Reg | FMC_VDDREG | FMC VDD Reg Voltage (V) | float | array | True |
| FMC VDD Raw | FMC_VDDRAW | FMC VDD Raw Voltage (V) | float | array | True |
| FMC Bandgap | FMC_BANDGAP | FMC Bandgap Voltage (V) | float | array | |
| FMC NTC0 Temperature | FMC_NTC0 | FMC NTC0 Temperature (Celsius) | float | array | |
| AM Bandgap | AM_BANDGAP | Analog Monitor Bandgap Voltage (counts) | integer | array | |
| AM Temperature | AM_TEMP | Analog Monitor Temperature (counts) | integer | array | |
| AM VDD Reg | AM_VDDREG | Analog Monitor VDD Reg Voltage (counts) | integer | array | |
| AM VDD Raw | AM_VDDRAW | Analog Monitor VDD Raw Voltage (counts) | integer | array | |
| Optimal LDO Setting | OPTIMAL_LDO_SETTING | Optimal LDO setting to reach 1.2 V | integer | single | True |
| Maximum LDO Voltage | MAX_LDO_FMC_VDDREG | Maximum bandgap voltage at LDO setting of zero (V) | float | single | True |
| Maximum LDO Setting for Plateau | MAX_LDO_SETTING | First LDO setting at which bandgap voltage begins to decrease (plateau ends) | integer | single | True |
| Test Quality | QUALITY | 1 if this chip passed, else 0 | integer | single | False |
| AM Bandgap (calc) | AM_BANDGAP_CALC | Analog Monitor Bandgap Voltage (calculated) | float | array | True |
| AM Temp (calc) | AM_TEMP_CALC | Analog Monitor Temperature (calculated, volts) | float | array | True |
| AM VDD Reg (calc) | AM_VDDREG_CALC | Analog Monitor VDD Reg Voltage (calculated) | float | array | True |
| AM VDD Raw (calc) | AM_VDDRAW_CALC | Analog Monitor VDD Raw Voltage (calculated) | float | array | True |
| AM Hybrid Ground (calc) | AM_HYBGND_CALC | Analog Monitor Hybrid Ground Voltage (calculated) | float | array | True |
| AM Calibration Voltage (calc) | AM_CAL_CALC | AM Input Calibration Voltage (V) | float | array | True |
| LDO Setting | LDO_SETTING | Setting of the LDO value for each data point collected | integer | array | True |
| FMC IDD | FMC_IDD | FMC IDD Current (mA) | float | array | |
| FMC VDD | FMC_VDD | FMC VDD Voltage (V) | float | array | |
| AM Hybrid Ground | AM_HYBGND | Analog Monitor Hybrid Ground Voltage (counts) | float | array | |
| AM Calibration Voltage | AM_CAL | AM Input Calibration Voltage (counts) | integer | array |
test code: HCCProbe_CalibrationScan¶
stages: PROBED
properties
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Probe Location | PROBE_LOCATION | Location where this test was performed | string | single | False |
| Wafer name | WAFER_NAME | Name of the wafer | string | single | False |
| Die Index | DIE_INDEX | Positional index on the Wafer Die | integer | single | False |
| Wafer X Position | WAFER_POS_X | Physical X position of this chip on the wafer die | integer | single | False |
| Wafer Y Position | WAFER_POS_Y | Physical Y position of this chip on the wafer die | integer | single | False |
| Probe Test Order Index | TEST_ORDER | Index of this test within probe test suite | integer | single | True |
| X-axis Variable | XNAME | Name of the variable used in the test scan for the x-axis | string | single | True |
| eFuse ID Hex | EFUSE_HEX | eFuse ID (hex) | string | single | True |
| eFuse ID | EFUSE | eFuse ID (integer) | integer | single | True |
| Software Info | SW_INFO | Dictionary of information related to ITSDAQ software | object | single | False |
| Probestation Name | PROBESTATION | Name of Probestation | string | single | False |
| Host computer name | HOST | Name of computer used for probing | string | single | False |
| User names | USER | Person(s) performing the Probe tests | string | single | False |
| FMC Hardware Name | FMC | Name of the FMC hardware used for probing | string | single | False |
| FMC Firmware Version | FIRMWARE_REVISION | Version of the firmware used on the FMC for probing | string | single | False |
| Y-range to use in Fit | MASK_STR | Range of values on the y-axis to use in the fit, ignoring a slice of values due to the comparator switch. | string | single | False |
parameters
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Test Quality | QUALITY | 2 if there is no gain (counts/mV) within 5% of unity (i.e. lowest gain is >1.05), otherwise 1 | integer | single | True |
| Linear Slopes of Gains (counts/V) | SLOPE | Fitted linear slope for each gain (counts/V) | float | array | True |
| Linear Intercepts of Gains (counts) | INTERCEPT | Fitted linear intercept for each gain (counts) | float | array | True |
| Gain1 Calibration Counts (y-axis) | CALIBRATION_COUNTS_GAIN1 | For gain 1, recorded calibration counts for each input calibration voltage that is scanned | integer | array | True |
| Failure Messages | FAILURE_MESSAGES | List of failure messages | string | array | True |
| Error on Linear Slopes of Gains (counts/V) | SLOPE_ERROR | Error on the fitted linear slope for each gain (counts/V) | float | array | True |
| Error on Linear Intercepts of Gains (counts) | INTERCEPT_ERROR | Error on the fitted linear intercept for each gain (counts) | float | array | True |
| Reduced Chi2 of Linear Fits | REDUCEDCHI2 | Reduced Chi2 of linear fits for each gain | float | array | True |
| Number of fitted degrees of freedom | NDF | Number of fitted points for each gain, relevant for reduced chi2 | integer | array | True |
| Fit minimum on the x-axis (V) | FITMIN | Starting point of fit (v) | float | array | True |
| Fit maximum on the x-axis (V) | FITMAX | Ending point of the fit (V), to ignore saturated edge | float | array | True |
| Optimal Gain Setting | OPTIMAL_GAIN_SETTING | Gain setting closest to 1000 counts per Volt | integer | single | True |
| Slope of Optimal Gain Setting | OPTIMAL_GAIN_SLOPE | Slope (counts/V) of optimal gain setting | float | single | True |
| Intercept of Optimal Gain Setting | OPTIMAL_GAIN_INTERCEPT | Intercept (counts) of optimal gain setting | float | single | True |
| Reduced Chi2 of Optimal Gain Setting | OPTIMAL_GAIN_REDUCEDCHI2 | Reduced Chi2 of optimal gain setting | float | single | True |
| Gain0 Calibration Counts (y-axis) | CALIBRATION_COUNTS_GAIN0 | For gain 0, recorded calibration counts for each input calibration voltage that is scanned | integer | array | True |
| Gain2 Calibration Counts (y-axis) | CALIBRATION_COUNTS_GAIN2 | For gain 2, recorded calibration counts for each input calibration voltage that is scanned | integer | array | True |
| Gain3 Calibration Counts (y-axis) | CALIBRATION_COUNTS_GAIN3 | For gain 3, recorded calibration counts for each input calibration voltage that is scanned | integer | array | True |
| Gain4 Calibration Counts (y-axis) | CALIBRATION_COUNTS_GAIN4 | For gain 4, recorded calibration counts for each input calibration voltage that is scanned | integer | array | True |
| Gain5 Calibration Counts (y-axis) | CALIBRATION_COUNTS_GAIN5 | For gain 5, recorded calibration counts for each input calibration voltage that is scanned | integer | array | True |
| Gain6 Calibration Counts (y-axis) | CALIBRATION_COUNTS_GAIN6 | For gain 6, recorded calibration counts for each input calibration voltage that is scanned | integer | array | True |
| Gain7 Calibration Counts (y-axis) | CALIBRATION_COUNTS_GAIN7 | For gain 7, recorded calibration counts for each input calibration voltage that is scanned | integer | array | True |
| Calibration Voltage (V) | CALIBRATION_VOLTAGE | List of input calibration voltages (V) used in the scan | float | array | True |
test code: HCCProbe_Digital_ExternalResets¶
stages: PROBED
properties
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Die Index | DIE_INDEX | Positional index on the Wafer Die | integer | single | True |
| eFuse ID | EFUSE | eFuse ID (integer) | integer | single | True |
| eFuse ID Hex | EFUSE_HEX | eFuse ID (hex) | string | single | True |
| FMC Firmware Version | FIRMWARE_REVISION | Version of the firmware used on the FMC for probing | string | single | False |
| FMC Hardware Name | FMC | Name of the FMC hardware used for probing | string | single | False |
| Host computer name | HOST | Name of computer used for probing | string | single | False |
| Probe Location | PROBE_LOCATION | Location where this test was performed | string | single | True |
| Probe Test Order Index | TEST_ORDER | Index of this test within probe test suite | integer | single | True |
| Probestation Name | PROBESTATION | Name of Probestation | string | single | False |
| Software Info | SW_INFO | Dictionary of information related to ITSDAQ software | object | single | False |
| User names | USER | Person(s) performing the Probe tests | string | single | False |
| Wafer name | WAFER_NAME | Name of the wafer | string | single | True |
| Wafer X Position | WAFER_POS_X | Physical X position of this chip on the wafer die | integer | single | True |
| Wafer Y Position | WAFER_POS_Y | Physical Y position of this chip on the wafer die | integer | single | True |
parameters
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Test Quality | QUALITY | 1 if this chip passed, else 0 | integer | single | False |
| Failure Messages | FAILURE_MESSAGES | List of failure messages | string | array | False |
| List of 1st attempt test failures | TEST_RETRIES | List of tests that failed the 1st attempt, before the automatic retry | string | array | False |
test code: HCCProbe_Digital_OutputIdles¶
stages: PROBED
properties
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Die Index | DIE_INDEX | Positional index on the Wafer Die | integer | single | True |
| eFuse ID | EFUSE | eFuse ID (integer) | integer | single | True |
| eFuse ID Hex | EFUSE_HEX | eFuse ID (hex) | string | single | True |
| FMC Firmware Version | FIRMWARE_REVISION | Version of the firmware used on the FMC for probing | string | single | False |
| FMC Hardware Name | FMC | Name of the FMC hardware used for probing | string | single | False |
| Host computer name | HOST | Name of computer used for probing | string | single | False |
| Probe Location | PROBE_LOCATION | Location where this test was performed | string | single | True |
| Probe Test Order Index | TEST_ORDER | Index of this test within probe test suite | integer | single | True |
| Probestation Name | PROBESTATION | Name of Probestation | string | single | False |
| Software Info | SW_INFO | Dictionary of information related to ITSDAQ software | object | single | False |
| User names | USER | Person(s) performing the Probe tests | string | single | False |
| Wafer name | WAFER_NAME | Name of the wafer | string | single | True |
| Wafer X Position | WAFER_POS_X | Physical X position of this chip on the wafer die | integer | single | True |
| Wafer Y Position | WAFER_POS_Y | Physical Y position of this chip on the wafer die | integer | single | True |
parameters
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Test Quality | QUALITY | 1 if this chip passed, else 0 | integer | single | False |
| Failure Messages | FAILURE_MESSAGES | List of failure messages | string | array | False |
| List of 1st attempt test failures | TEST_RETRIES | List of tests that failed the 1st attempt, before the automatic retry | string | array | False |
test code: HCCProbe_FuseID¶
stages: PROBED
properties
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Die Index | DIE_INDEX | Positional index on the Wafer Die | integer | single | True |
| eFuse ID | EFUSE | eFuse ID (integer) | integer | single | True |
| eFuse ID Hex | EFUSE_HEX | eFuse ID (hex) | string | single | True |
| FMC Firmware Version | FIRMWARE_REVISION | Version of the firmware used on the FMC for probing | string | single | False |
| FMC Hardware Name | FMC | Name of the FMC hardware used for probing | string | single | False |
| Host computer name | HOST | Name of computer used for probing | string | single | False |
| Probe Location | PROBE_LOCATION | Location where this test was performed | string | single | True |
| Probe Test Order Index | TEST_ORDER | Index of this test within probe test suite | integer | single | True |
| Probestation Name | PROBESTATION | Name of Probestation | string | single | False |
| Software Info | SW_INFO | Dictionary of information related to ITSDAQ software | object | single | False |
| User names | USER | Person(s) performing the Probe tests | string | single | False |
| Wafer name | WAFER_NAME | Name of the wafer | string | single | True |
| Wafer X Position | WAFER_POS_X | Physical X position of this chip on the wafer die | integer | single | True |
| Wafer Y Position | WAFER_POS_Y | Physical Y position of this chip on the wafer die | integer | single | True |
parameters
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Test Quality | QUALITY | 1 if this chip passed, else 0 | integer | single | False |
| Failure Messages | FAILURE_MESSAGES | List of failure messages | string | array | False |
| Read eFuse ID | EFUSE | Read eFuse ID (integer) | integer | single | True |
| Read eFuse ID Hex | EFUSE_HEX | Read eFuse ID (hex) | string | single | True |
test code: HCCProbe_Digital_TriplicatedClocks¶
stages: PROBED
properties
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Die Index | DIE_INDEX | Positional index on the Wafer Die | integer | single | True |
| eFuse ID | EFUSE | eFuse ID (integer) | integer | single | True |
| eFuse ID Hex | EFUSE_HEX | eFuse ID (hex) | string | single | True |
| FMC Firmware Version | FIRMWARE_REVISION | Version of the firmware used on the FMC for probing | string | single | False |
| FMC Hardware Name | FMC | Name of the FMC hardware used for probing | string | single | False |
| Host computer name | HOST | Name of computer used for probing | string | single | False |
| Probe Location | PROBE_LOCATION | Location where this test was performed | string | single | True |
| Probe Test Order Index | TEST_ORDER | Index of this test within probe test suite | integer | single | True |
| Probestation Name | PROBESTATION | Name of Probestation | string | single | False |
| Software Info | SW_INFO | Dictionary of information related to ITSDAQ software | object | single | False |
| User names | USER | Person(s) performing the Probe tests | string | single | False |
| Wafer name | WAFER_NAME | Name of the wafer | string | single | True |
| Wafer X Position | WAFER_POS_X | Physical X position of this chip on the wafer die | integer | single | True |
| Wafer Y Position | WAFER_POS_Y | Physical Y position of this chip on the wafer die | integer | single | True |
parameters
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Test Quality | QUALITY | 1 if this chip passed, else 0 | integer | single | False |
| Failure Messages | FAILURE_MESSAGES | List of failure messages | string | array | False |
| List of 1st attempt test failures | TEST_RETRIES | List of tests that failed the 1st attempt, before the automatic retry | string | array | False |
test code: HCCProbe_Digital_ShmooScan¶
stages: PROBED
properties
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Die Index | DIE_INDEX | Positional index on the Wafer Die | integer | single | True |
| eFuse ID | EFUSE | eFuse ID (integer) | integer | single | True |
| eFuse ID Hex | EFUSE_HEX | eFuse ID (hex) | string | single | True |
| FMC Firmware Version | FIRMWARE_REVISION | Version of the firmware used on the FMC for probing | string | single | False |
| FMC Hardware Name | FMC | Name of the FMC hardware used for probing | string | single | False |
| Host computer name | HOST | Name of computer used for probing | string | single | False |
| Probe Location | PROBE_LOCATION | Location where this test was performed | string | single | True |
| Probe Test Order Index | TEST_ORDER | Index of this test within probe test suite | integer | single | True |
| Probestation Name | PROBESTATION | Name of Probestation | string | single | False |
| Software Info | SW_INFO | Dictionary of information related to ITSDAQ software | object | single | False |
| User names | USER | Person(s) performing the Probe tests | string | single | False |
| Wafer name | WAFER_NAME | Name of the wafer | string | single | True |
| Wafer X Position | WAFER_POS_X | Physical X position of this chip on the wafer die | integer | single | True |
| Wafer Y Position | WAFER_POS_Y | Physical Y position of this chip on the wafer die | integer | single | True |
parameters
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Test Quality | QUALITY | 1 if this chip passed, else 2 | integer | single | False |
| LDO Setting | LDO_SETTING | Setting of the LDO value for each data point collected | integer | array | True |
| Failure Messages | FAILURE_MESSAGES | List of failure messages | string | array | False |
| FMC VDDReg | FMC_VDDREG | Regulated voltage as measured by the FMC (V) | float | array | False |
| L0 Trigger Status | L0_TRIGGER_STATUS | 1 if L0 trigger test passed, else 0 | integer | array | False |
| BTC Clock Rate | BTC_RATE | Input clock rate for the HCC clock generator (MHz) | float | array | True |
test code: HCCProbe_Startup¶
stages: PROBED
properties
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Die Index | DIE_INDEX | Positional index on the Wafer Die | integer | single | True |
| eFuse ID | EFUSE | eFuse ID (integer) | integer | single | True |
| eFuse ID Hex | EFUSE_HEX | eFuse ID (hex) | string | single | True |
| FMC Firmware Version | FIRMWARE_REVISION | Version of the firmware used on the FMC for probing | string | single | False |
| FMC Hardware Name | FMC | Name of the FMC hardware used for probing | string | single | False |
| Host computer name | HOST | Name of computer used for probing | string | single | False |
| Probe Location | PROBE_LOCATION | Location where this test was performed | string | single | True |
| Probe Test Order Index | TEST_ORDER | Index of this test within probe test suite | integer | single | True |
| Probestation Name | PROBESTATION | Name of Probestation | string | single | False |
| Software Info | SW_INFO | Dictionary of information related to ITSDAQ software | object | single | False |
| User names | USER | Person(s) performing the Probe tests | string | single | False |
| Wafer name | WAFER_NAME | Name of the wafer | string | single | True |
| Wafer X Position | WAFER_POS_X | Physical X position of this chip on the wafer die | integer | single | True |
| Wafer Y Position | WAFER_POS_Y | Physical Y position of this chip on the wafer die | integer | single | True |
parameters
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Test Quality | QUALITY | 1 if this chip passed, else 0 | integer | single | False |
| Failure Messages | FAILURE_MESSAGES | List of failure messages | string | array | False |
| Startup Voltage | STARTUP_VOLTAGE | FMC regulated voltage on startup | float | single | True |
test code: FAST_TID¶
stages: ON_SCB
properties
NB required flag missing
parameters
NB required flag missing
test code: PULL_TEST¶
stages: BOND_PULLING
properties
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Name of Operator | OPERATOR | Name of Operator | string | single | True |
| Pull Test Machine | PULL_TEST_MACHINE | Used Pull Test Machine | string | single | False |
| Number of Pulled Wires | NUMBER_WIRES | Total Number of pulled wires | integer | single | True |
| Wire Bond Machine | WIRE_BOND_MACHINE | Used Wire Bond Machine | string | single | False |
parameters
| name | code | description | dataType | valueType | required |
|---|---|---|---|---|---|
| Mean pull strength [g] | MEAN | Mean pull strength [g] | float | single | |
| Pull Strenght [g] | PULL_STRENGTH | Pull strength of all wires [g] | float | array | |
| Pull Grade | PULL_GRADE | Grade of each wire | integer | array | |
| Standard Deviation [g] | STANDARD_DEVIATION | Standard Deviation [g] | float | single | |
| Number of wire pulls with less than 5g | TOO_LOW | Number of wire pulls with less than 5g | integer | single | |
| Minimum pull strength [g] | MINIMUM_STRENGTH | Lowest pull strength measured for a single wire during pull test [g] | float | single | |
| Maximum pull strength [g] | MAXIMUM_STRENGTH | Highest pull strength measured for a single wire during pull test [g] | float | single | |
| Percentage of heel breaks [%] | HEEL_BREAKS | Percentage of wire pulls with heel breaks [%] | float | single | |
| Pull Test File | FILE | Pull Test File | binary | single |
test code: VISUAL_INSPECTION¶
stages: CATEGORY_A
properties
NB required flag missing
parameters
NB required flag missing